Book

Strategies To Reduce Power During Vlsi Circuit Testing

Reduction of Dynamic and Leakage Power during Testing of Digital VLSI Circuits «

Score:

(3/0)

Reviews:

0

Times tipped:

0

Times read:

0

Author(s):

Subhadip Kundu

Category:

ISBN

9783659255205

Information

Reviews

Wall

Welcome to Boeklezers.nl

Boeklezers.nl is a network for social reading. We help readers discover new books and authors, and bring readers in contact with each other and with writers. Read more ».

There are no messages on Strategies To Reduce Power During Vlsi Circuit Testing wall yet.