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Hi, I wanted to tell you about the book: In-Line Characterization, Yield, Reliability, And Failure Analysis In Microelectronic Manufacturing Ii by Larg H. Weiland & Gudrun Kissinger. http://www.boeklezers.com/boeken/In-Line+Characterization%2C+Yield%2C+Reliability%2C+And+Failure+Analysis+In+Microelectronic+Manufacturing+Ii/9780819441072 Kind regards,
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