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Hi, I wanted to tell you about the book: Angewandte Oberflachenanalyse Mit Sims Sekundar-ionen-massenspektrometrie Aes Auger-elektronen-spektrometrie Xps Rontgen-photoelektronen-spektrometrie by M. Grasserbauer & H.J. Dudek. http://www.boeklezers.com/boeken/Angewandte+Oberflachenanalyse+Mit+Sims+Sekundar-ionen-massenspektrometrie+Aes+Auger-elektronen-spektrometrie+Xps+Rontgen-photoelektronen-spektrometrie/9783642701788 Kind regards,
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