This book explains concepts of transmission electron microscopy TEM and xraydiffractometry XRD that are important for the characterization of materials.The thir... » 

This book explains concepts of transmission electron microscopy TEM and xraydiffractometry XRD that are important for the characterization of materials.The third edition has been updated to cover important technical developmentsincluding the remarkable recent improvement in resolution of the TEM. Thisedition is not substantially longer than the second but all chapters have beenupdated and revised for clarity. A new chapter on high resolution STEM methodshas been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids and the similarities and differencesof using xrays electrons or neutrons for diffraction measurements.Diffraction effects of crystalline order defects and disorder in materialsare explained in detail. Both practical and theoretical issues are covered. Thebook can be used in an introductorylevel or advancedlevel course sincesections are identified by difficulty. Each chapter includes a set of problemsto illustrate principles and the extensive Appendix includes laboratoryexercises. «