High speed and Highly Accurate Tip-Scanning Atomic Force Microscope by Dong-Yeon Lee
Buy now!

Book

High speed and Highly Accurate Tip-Scanning Atomic Force Microscope

Design Methodology, Control Strategy, and Performance Evaluation for the Tip-scanning Atomic Force Microscope for the Industrial Large Samples « 

Score:
 
 
 
 
 
 (3/0)

Reviews:
0 
Times tipped:
0 
Times read:
0 
Author(s):
  
Category:
 
ISBN
9783639002706

 
Mail a friend 
Share on Twitter 



 
Information
 
 
Reviews
 
 
 
Wall
 
 
 
Related
 
 
 
Readers
 
 

Welcome to Boeklezers.nl

Boeklezers.nl is a network for social reading. We help readers discover new books and authors, and bring readers in contact with each other and with writers. Read more ».

Sign Up

Reviews of High speed and Highly Accurate Tip-Scanning Atomic Force Microscope by Dong-Yeon Lee

There are no reviews for this book yet.

 
More reviews »
 
domReadyCallbacks.push( function() { new Error('Sorry, you can only do this when you're logged in. If you're not a member yet, please join us.'); });