Atomic Force Microscopy/Scanning Tunneling Microscopy by Simon A. Cohen
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Atomic Force Microscopy/Scanning Tunneling Microscopy

Proceedings of the First U.S.Army Natick Research, Development and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, Held in Natick, Massachusetts, June 8-10, 1993 « 

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ISBN
9780306448904

 
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